Please contact Ryan Anderson at rranderson@soe.ucsd.edu for training and/or questions about the DualBeam. Features include:

• xT software version 7.x and new xT UI
• NICol electron column
• High-throughput ion column
• Cryo stage
• 110 x 110 mm eucentric stage
• Selective Carbon Mill
• Insulator Enhanced Etch
• Platinum Deposition (Pt)
• FEI EasyLift LT NanoManipulator
• In-lens detectors: Lower (T1) BSE and Upper (T2) SE
• SE detector (ET-SED)
• Oil-free pumping system
• Integrated current measurement
• Automatic aperture system
• AutoSlice and View G3 Extended Package
• AutoTEM G2