Multimode microscope with Nanoscope IV controller. The MultiMode performs a full range of SPM techniques for surface characterization of properties like topography, elasticity, electrical and magnetic fields:

- Tapping Mode

- Contact Mode AFM

- Phase Imaging

- Magnetic Force Microscopy (MFM)

- Scanning Tunneling Microscopy (STM)

- Electric Force Microscopy (EFM)

- Surface Potential Microscopy

• 10 µm x 10 µm non-magnetic scanner with 2.5µm vertical range.
• 125 µm x 125 µm non-magnetic scanner with 5µm vertical range.