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Equipment
Name:
FEI SFEG UHR SEM
Equipment Type:
Materials Characterization
Description:
The FEI XL30 features the FEI Sirion column which enables very high resolution imaging at low KV. Using UHR (Ultra High Resolution) mode and the Through Lens Detector, resolution of 1nm is possible at 10KV or higher and 1.7nm at 1KV.
Location
1420
Microscopy Lab
Horiba XRF Microscope
Veeco Scanning Probe Microscope
FEI SFEG UHR SEM
Phillips XL30 ESEM
Axio Fluorescence Microscope
FEI Scios DualBeam FIB/SEM
Tousimis AutoSamdri 815A
Emitech K575X Sputter Coater