Field emission environmental scanning electron microscope provides extremely high resolution (2nm) images in high vacuum mode using the Secondary Electron detector at 30kV. Low kV imaging, down to .5kV, allows the user to view very sensitive and delicate specimen such as carbon nanotubes. The solid state Back Scattered Electron Detector detects contrast between area of differing chemical composition. Environmental mode allows the user to image nonconducting samples at low vacuum with water vapor backfilled into the vacuum chamber. Software based controls allow for easy image parameter adjustment. Oxford EDX attachment and Inca Software allow user to determine elemental make up and compositional mapping of sample surfaces.