facilities
Facility User Rates
cleanroom floorplan
personnel
Courses
equipment
Back End Processing
Dry Etching
Ebeam Lithography
Materials Characterization
Metalization / Thin Film Deposition
Metrology
Photolithography
Thermal Processing
all equipment
access
UCSD internal users
non-UCSD external users
Safety
Statement
Evacuation Map
Resources
Services
E-Beam Lithography
Dicing
Microfluidics
Login
username:
password:
Remember me on this computer:
Lost username/ password
Room 1419 - Metrology
Equipment:
Dektak 150
HP 4155 Parametric Analyzer/Probe Station
Jandel Four Point Probe with RM3000 Test Unit
Rudolph Auto EL Ellipsometer
Toho Technology FLX-2320 Thin Film Stress Measurement System
Veeco NT1100 Optical Profiling System
Toho Technology FLX-2320 Thin Film Stress Measurement System
HP 4155 Parametric Analyzer/Probe Station
Dektak 150
Veeco NT1100 Optical Profiling System
Rudolph Auto EL Ellipsometer
Jandel Four Point Probe with RM3000 Test Unit
